Author:
Stellari F.,Song P.,Tsang J.C.,McManus M.K.,Ketchen M.B.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
25 articles.
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1. Exploring Security of Embedded SRAM in PIC and RISC-V Chips: Insights from Image Processing of Low-Cost Photon Emission Microscopy;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24
2. Simulation An Integrated Sensor As An Element Of CMOS Inverter;2021 IEEE 16th International Conference on the Experience of Designing and Application of CAD Systems (CADSM);2021-02-22
3. 1D and 2D Time-Resolved Emission Measurements of Circuits Fabricated in 14 nm Technology Node;2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2020-07-20
4. Low Voltage Time-Resolved Emission (TRE) Measurements of VLSI Circuit;2020 China Semiconductor Technology International Conference (CSTIC);2020-06-26
5. Structures and Methods for Fully-Integrated Quantum Random Number Generators;IEEE Journal of Selected Topics in Quantum Electronics;2020-05