Author:
Li Li ,Xue Jie,Ahmad Mudasir,Brillhart Mark,Lu Gary,Luo Zhiquan,Im Jay,Ho Paul S.
Cited by
2 articles.
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1. References;Reliability Prediction for Microelectronics;2024-02-16
2. Reliability of microelectronics packaging in the era of EnergyWise and Borderless networks;2010 IEEE International Reliability Physics Symposium;2010