A 37–43.5-GHz Phase and Amplitude Detection Circuit With 0.049° and 0.036-dB Accuracy for 5G Phased-Array Calibration Using Transformer-Based Injection-Enhanced ILFD-Reference-Cited by-同舟云学术

A 37–43.5-GHz Phase and Amplitude Detection Circuit With 0.049° and 0.036-dB Accuracy for 5G Phased-Array Calibration Using Transformer-Based Injection-Enhanced ILFD

Published:2023-10 Issue:10 Volume:58 Page:2851-2860
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Yamazaki Yudai¹^ORCID,Sakamaki Jun¹,Pang Jian¹^ORCID,Alvin Joshua¹,Li Zheng¹^ORCID,You Dongwon¹,Mayeda Jill¹^ORCID,Shirane Atsushi¹,Okada Kenichi¹^ORCID

Affiliation:

1. Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo, Japan

Funder

Ministry of Internal Affairs and Communications in Japan

Japan Society for the Promotion of Science

Tokyo Tech Advanced Researchers

VLSI Design and Education Center (VDEC) in collaboration with Cadence Design Systems, Inc., Mentor Graphics, Inc., and Keysight Technologies Japan, Ltd

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/4/10262388/10129086.pdf?arnumber=10129086

Reference31 articles.

1. A 2–15-GHz Accurate Built-in-Self-Test System for Wideband Phased Arrays Using Self-Correcting Eight-State $I/Q$ Mixers

2. A 39-GHz 64-Element Phased-Array Transceiver With Built-In Phase and Amplitude Calibrations for Large-Array 5G NR in 65-nm CMOS

3. A Phased Array RFIC With Built-In Self-Test Capabilities

4. A 76–84-GHz 16-Element Phased-Array Receiver With a Chip-Level Built-In Self-Test System

5. A study of injection locking and pulling in oscillators

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