Author:
Huang Ning,Chen Weiwei,Li Ruiying,Kang Rui
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. The development of logic-probabilistic reliability model of the main electrical scheme;Journal of Physics: Conference Series;2022-12-01
2. Application Reliability Evaluation for Tactical Internet Based on OPNET;2015 IEEE 12th Intl Conf on Ubiquitous Intelligence and Computing and 2015 IEEE 12th Intl Conf on Autonomic and Trusted Computing and 2015 IEEE 15th Intl Conf on Scalable Computing and Communications and Its Associated Workshops (UIC-ATC-ScalCom);2015-08