Comparison of magnetic images using point and thin-film magnetic force microscopy tips
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx5/20/17367/00800731.pdf?arnumber=800731
Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Building high-coverage monolayers of covalently bound magnetic nanoparticles;Applied Surface Science;2016-12
2. Parameters of the magnetic force microscope probe optimized for high-resolution measurements;Technical Physics Letters;2008-06
3. Studies on the magnetic properties for single-phase nanocrystalline FePt magnets with different orientation degrees;Journal of Magnetism and Magnetic Materials;2007-05
4. Magnetic Force Microscopy Study of Alternate Sputtered (001), Oriented L1 0 Phase FePt Films;Chinese Physics Letters;2007-01
5. Magnetic Microstructures of 2:17 Type Sm(Co, Fe, Cu, Zr)z Magnets Detected by Magnetic Force Microscopy;Journal of Rare Earths;2006-01
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