Author:
Srinivas M.K.,Agrawal V.D.,Bushnell M.L.
Cited by
2 articles.
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1. Self-Test Library Generation for In-Field Test of Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11
2. Oscillation and Transition Tests for Synchronous Sequential Circuits;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2013-12