IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware-Reference-Cited by-同舟云学术

IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware

Published:2021-11 Issue: Volume: Page:
ISSN:
Container-title:2021 36th IEEE/ACM International Conference on Automated Software Engineering (ASE)
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Author:

Liu Peiyu,Ji Shouling,Zhang Xuhong,Dai Qinming,Lu Kangjie,Fu Lirong,Chen Wenzhi,Cheng Peng,Wang Wenhai,Beyah Raheem

Funder

National Key Research and Development Program of China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9678507/9678392/09678785.pdf?arnumber=9678785

Reference55 articles.

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4. An empirical study on arm disassembly tools;muhui;Proc of ACM SIGSOFT international symposium on Software testing and analysis,2020

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