Susceptibility of Optocoupler to Conducted EMI
Author:
Affiliation:
1. Research Institute for Frontier Science, Beihang University,Beijing,China,100191
2. School of Electronic and Information Engineering, Beihang University,Beijing,China,100191
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10426787/10426807/10426861.pdf?arnumber=10426861
Reference10 articles.
1. Electron Beam Induced Degradation in Electrical Characteristics of Optocoupler
2. Defects simulation of optocoupler based on low-frequency noise analysis
3. Modeling and Control Design of a Current-Mode Controlled Flyback Converter with Optocoupler Feedback
4. Small-Signal Analysis and Control Design of Isolated Power Supplies With Optocoupler Feedback
5. Failure mechanisms and package reliability issues in optocouplers
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