High-Intensified Resemblance and Statistic-Restructured Alignment in Few-Shot Domain Adaptation for Industrial-Specialized Employment-Reference-Cited by-同舟云学术

High-Intensified Resemblance and Statistic-Restructured Alignment in Few-Shot Domain Adaptation for Industrial-Specialized Employment

Published:2023-08 Issue:3 Volume:69 Page:353-365
ISSN:0098-3063
Container-title:IEEE Transactions on Consumer Electronics
language:
Short-container-title:IEEE Trans. Consumer Electron.

Author:

Petchhan Jirayu¹^ORCID,Su Shun-Feng¹^ORCID

Affiliation:

1. Department of Electrical Engineering, National Taiwan University of Science and Technology, Taipei City, Taiwan

Funder

“Center for Cyber-Physical System Innovation” from the Featured Areas Research Center Program within the framework of the Higher Education Sprout Project by the Ministry of Education in Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Media Technology

Link

http://xplorestaging.ieee.org/ielx7/30/10221725/10045719.pdf?arnumber=10045719

Reference63 articles.

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