Improved Shape Memory Alloy-based MEMS Perforated Switch for RF Applications-Reference-Cited by-同舟云学术

Improved Shape Memory Alloy-based MEMS Perforated Switch for RF Applications

Published:2023-04-08 Issue: Volume: Page:
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Container-title:2023 IEEE 12th International Conference on Communication Systems and Network Technologies (CSNT)
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Author:

Bale Ajay Sudhir¹,Ghorpade Naveen²,Hamsalekha R³,Pushpanjali J⁴,Deepan William²,Herial Juweriah¹

Affiliation:

1. New Horizon College of Engineering,Department of Electronics and Communication Engineering,Bengaluru,India

2. Vijaya Vittala Institute of Technology,Department of Computer Science Engineering,Bengaluru,India

3. CMR University,Department of Electronics and Communication Engineering,Bengaluru,India

4. Institute of Technology,Bengaluru,India

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10134573/10134574/10134651.pdf?arnumber=10134651

Reference12 articles.

1. RF MEMS from a device perspective

2. Symmetric boundary conditions in FEA;analysis;Cadence com 09-Mar-2022,2022

3. Effect of Perforation Ratio on the Actuatio voltage reduction of a Tri-Electrode Electrostatic Actuator, ``2018 International conference on optical MEMS and Nanophotonics;zhou,2018

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