Catastrophic Failure Modes Limit Redundancy Effectiveness
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx5/24/5221704/05221712.pdf?arnumber=5221712
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optimal redundancy of K-out-of-n:G system with two kinds of CCFs;Microelectronics Reliability;1994-06
2. Cost—Optimal replacement policy () for a parallel system with common cause failure;Reliability Engineering & System Safety;1991-01
3. On common-cause failures—Bibliography;Microelectronics Reliability;1990-01
4. Optimal replacement policy (N∗, n∗) for a parallel system with common cause failure and geometric repair time;Microelectronics Reliability;1990-01
5. A Highly Reliable Memory Subsystem Design Employing SECDED, Column Sparing, and Paging;IEEE Transactions on Reliability;1986
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