Unsupervised Automatic Defect Inspection based on Image Matching and Local One-class Classification

Author:

Lv Chengkan1,Zhang Zhengtao1,Shen Fei1,Zhang Feng1

Affiliation:

1. Chinese Academy of Sciences,Institute of Automation,Beijing,China

Publisher

IEEE

Reference29 articles.

1. A novel pixel-wise defect inspection method based on stable background reconstruction;lv;IEEE Transactions on Instrumentation and Measurement,2020

2. Draem-a discriminatively trained reconstruction embedding for surface anomaly detection;vitjan;Proceedings of IEEE Conference on Computer Vision and Pattern Recognition,2021

3. Uninformed students: student-teacher anomaly detection with discriminative latent embeddings;paul;Proceedings of IEEE Conference on Computer Vision and Pattern Recognition,2020

4. MVTec AD -- A comprehensive real-world dataset for unsupervised anomaly detection;paul;Proceedings of IEEE Conference on Computer Vision and Pattern Recognition,2019

5. Ganomaly: semisupervised anomaly detection via adversarial training;samet;Proceedings of Asian Conference Computer Vision,2018

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