Comparing Simulated Impact of Single Frequency and Multitone EMI for an Integrated Circuit-Reference-Cited by-同舟云学术

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Comparing Simulated Impact of Single Frequency and Multitone EMI for an Integrated Circuit

Published:2022-03-09 Issue: Volume: Page:
ISSN:
Container-title:2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)
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Author:

Devaraj Lokesh¹,Khan Qazi Mashaal²,Ruddle Alastair R.¹,Duffy Alistair P.³

Affiliation:

1. HORIBA MIRA Limited,Dept. Vehicle Resilience,Nuneaton,UK

2. ESEO/INSA Rennes,Dept. Electrical and Control Eng.,Angers/Rennes,France

3. De Montfort University,Dept. Engineering and Sustainable Development,Leicester,UK

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9758575/9758588/09758612.pdf?arnumber=9758612

Reference12 articles.

1. Combined effects of several, simultaneous, EMI couplings

2. Signal integrity testing using multiple out-of-band sources in a reverberation chamber

3. Testing for immunity to simultaneous disturbances and similar issues for risk managing EMC

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