Security Properties Driven Pre-Silicon Laser Fault Injection Assessment-Reference-Cited by-同舟云学术

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Security Properties Driven Pre-Silicon Laser Fault Injection Assessment

Published:2022-06-27 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
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Author:

Pundir Nitin¹,Li Henian¹,Lin Lang²,Chang Norman²,Farahmandi Farimah¹,Tehranipoor Mark¹

Affiliation:

1. University of Florida

2. Ansys, Inc.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9839666/9839669/09840109.pdf?arnumber=9840109

Reference11 articles.

1. Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS

2. Building the electrical model of the pulsed photoelectric laser stimulation of an NMOS transistor in 90nm technology

3. Electrical modeling of the photoelectric effect induced by a pulsed laser applied to an SRAM cell

4. New Differential Fault Analysis on AES Key Schedule: Two Faults Are Enough

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. FLAT: Layout-Aware and Security Property-Assisted Timing Fault-Injection Attack Assessment;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-06

2. Tampered energy meter information conveyed to concerned authority by wireless communication;E3S Web of Conferences;2024

3. Secure Physical Design;Hardware Security;2024

4. Laser Fault Injection Attack (FIA);Hardware Security Training, Hands-on!;2023

5. CAD for Fault Injection Detection;CAD for Hardware Security;2023

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