Testing configurable LUT-based FPGA's-Reference-Cited by-同舟云学术

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Testing configurable LUT-based FPGA's

Published:1998-06 Issue:2 Volume:6 Page:276-283
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Wei Kang Huang ,Meyer F.J.,Xiao-Tao Chen ,Lombardi F.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx4/92/14940/00678888.pdf?arnumber=678888

Cited by 59 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. ATTEST: Application-Agnostic Testing of a Novel Transistor-Level Programmable Fabric;2020 IEEE 38th VLSI Test Symposium (VTS);2020-04

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