Development of Testing Methods to Predict Cracking in Photovoltaic Backsheets-Reference-Cited by-同舟云学术

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Development of Testing Methods to Predict Cracking in Photovoltaic Backsheets

Published:2019-06 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)
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Author:

Kempe Michael D.,Lockman Trevor,Morse Joshua

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8963747/8980458/08980818.pdf?arnumber=8980818

Cited by 17 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of Surface Crack Formation in Photovoltaic Backsheets Using Fragmentation and Finite Element Simulations;IEEE Journal of Photovoltaics;2024-03

2. Setting Priorities for Photovoltaic Reliability Research Using Criticality Analysis;IEEE Journal of Photovoltaics;2024-01

3. Machine learning assisted representative period selection as input to modelling of field degradation in photovoltaic modules;Solar Energy Materials and Solar Cells;2023-12

4. Investigation of the crack propensity of co-extruded polypropylene backsheet films for photovoltaic modules;Solar Energy Materials and Solar Cells;2023-08

5. Long-term durability of transparent backsheets for bifacial photovoltaics: An in-depth degradation analysis;Solar Energy Materials and Solar Cells;2023-07

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