Design and Validation of an Automation Strategy for the Strip Test Process in the Semiconductor Industry-Reference-Cited by-同舟云学术

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Design and Validation of an Automation Strategy for the Strip Test Process in the Semiconductor Industry

Published:2023-03-03 Issue: Volume: Page:
ISSN:
Container-title:2023 International Conference on Robotics and Automation in Industry (ICRAI)
language:
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Author:

Rahman Muhamad Arfauz A¹,Lin Chengsi¹,Maropoulus Paul G.¹,Teoh Woei Sheng²,Rahman Azrul Azwan Abdul²,Mohamad Effendi²

Affiliation:

1. School of Mechanical and Aerospace Engineering Queen's University Belfast,Belfast,Ireland

2. Universiti Teknikal Malaysia Melaka,Faculty of Manufacturing Engineering,Melaka,Malaysia

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10089530/10089531/10089538.pdf?arnumber=10089538

Reference20 articles.

1. Tackling the rising cost-of-test for semiconductor devices;ramsey;Solid State Technology,2011

2. Review of wide band-gap semiconductors technology

3. Comparison of Semiconducting Polymer Dots and Semiconductor Quantum Dots for Smartphone-Based Fluorescence Assays

4. Industry 4.0: Development of a multi-agent system for dynamic value stream mapping in SMEs

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Study on 3D Computer-Aided Feature Inspection for Product Design and Analysis;The 39th International Manufacturing Conference;2024-03-11

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