Low-Contact Resistance Probe Card Using MEMS Technology-Reference-Cited by-同舟云学术

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Low-Contact Resistance Probe Card Using MEMS Technology

Published:2014-12 Issue:12 Volume:63 Page:2882-2889
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Kandalaft Nabeeh,Basith Iftekhar Ibne,Rashidzadeh Rashid

Funder

CMC Microsystems

National Science and Engineering Research Council of Canada

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/6940066/06819860.pdf?arnumber=6819860

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1. 50 GHz Four-Port Coupling-Reduced Probe Card Utilizing Pogo Pins Housed in Custom Metallic Socket;Sensors;2024-06-09

2. Low-Loss Pogo Pin Probe Card with a Coupling Isolation Structure up to 50 GHz;Sensors;2023-06-08

3. Twin-Wire Networks for Zero Interconnect, High-Density 4-Wire Electrical Characterizations of Materials;Research;2022-01

4. A comparison of pad metallization in miniaturized microfabricated silicon microcantilever-based wafer probes for low contact force low skate on-wafer measurements;Journal of Micromechanics and Microengineering;2021-12-08

5. Carbon nanotube micro-contactors on ohmic substrates for on-chip microelectromechanical probing applications at wafer level;Carbon;2019-09

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