Author:
Gerardin S.,Bagatin M.,Paccagnella A.,Bisello D.,Giubilato P.,Mattiazzo S.,Pantano D.,Silvestrin L.,Tessaro M.,Wyss J.,Ferlet-Cavrois V.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
6 articles.
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1. Analysis of Ion-Induced SEFI and SEL Phenomena in 90 nm NOR Flash Memory;IEEE Transactions on Nuclear Science;2021-10
2. High Current Events Triggered by Heavy Ion Microbeam and Pulsed Laser on a MRAM;2020 20th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2020-10
3. High Current Event and Single Event Functional Interrupt in Non-Volatile Memories;2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2018-09
4. Space and terrestrial radiation effects in flash memories;Semiconductor Science and Technology;2017-02-21
5. SPES and the neutron facilities at Laboratori Nazionali di Legnaro;The European Physical Journal Plus;2016-03