Author:
Chaudhuri Arjun,Banerjee Sanmitra,Park Heechun,Ku Bon Woong,Chakrabarty Krishnendu,Lim Sung-Kyu
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Traders and Tinkers;Cult Econ Life;2023-08-10
2. Built-In Self-Test of High-Density and Realistic ILV Layouts in Monolithic 3-D ICs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-03
3. MIV Fault Modeling Method Based on Finite Element Analysis;2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA);2021-11-24
4. RTL-to-GDS design tools for monolithic 3D ICs;Proceedings of the 39th International Conference on Computer-Aided Design;2020-11-02