Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs-Reference-Cited by-同舟云学术

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Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs

Published:2023-10-03 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Author:

Böhmer Kevin¹,Forlin Bruno¹,Cazzaniga Carlo²,Rech Paolo³,Furano Gianluca⁴,Alachiotis Nikolaos¹,Ottavi Marco¹

Affiliation:

1. University of Twente,The Netherlands

2. Rutherford Appleton Laboratory,UK

3. Univeristy of Trento,Italy

4. European Space Agency,The Netherlands

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10313343/10313345/10313556.pdf?arnumber=10313556

Reference19 articles.

1. Experimental evaluation of neutron-induced errors on a multicore RISC-V platform

2. Neutron SEE Testing of the 65nm SmartFusion2 Flash-Based FPGA

3. Experimental study on Hamming and Hsiao codes in the context of embedded applications

4. Evaluation of RISC-V Silicon Under Neutron Radiation

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers;2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS);2024-07-03

2. Assessment of RISC-V Processor Suitability for Satellite Applications;Proceedings of the 21st ACM International Conference on Computing Frontiers: Workshops and Special Sessions;2024-05-07

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