LED Lifetime Prediction Under Thermal-Electrical Stress-Reference-Cited by-同舟云学术

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LED Lifetime Prediction Under Thermal-Electrical Stress

Published:2021-09 Issue:3 Volume:21 Page:310-319
ISSN:1530-4388
Container-title:IEEE Transactions on Device and Materials Reliability
language:
Short-container-title:IEEE Trans. Device Mater. Relib.

Author:

Tan Kai-Zhe^ORCID,Lee See-Keong,Low Heng-Chin

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/7298/9528863/09446599.pdf?arnumber=9446599

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Weibull–lognormal-based life prediction model for LED light with four groups of ADTs;Lighting Research & Technology;2024-06-24

2. A survey on LED Prognostics and Health Management and uncertainty reduction;Microelectronics Reliability;2024-06

3. Constant-Stress ADTs and Weibull-Based Lifetime Estimation of LED Lamp;Journal of Electronic Materials;2024-03-18

4. Overview of high-power LED life prediction algorithms;Frontiers in Sustainable Energy Policy;2024-03-04

5. Uncertainty analysis and interval prediction of LEDs lifetimes;Reliability Engineering & System Safety;2024-02

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