Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles-Reference-Cited by-同舟云学术

Reliability of VO textsubscript 2-Based mmWave Switches Under 100 Million Thermal Cycles

Author:

Chen Shangyi¹^ORCID,Lust Mark¹,Roo Annie¹,Ghalichechian Nima²^ORCID

Affiliation:

1. ElectroScience Laboratory and the Department of Mechanical and Aerospace Engineering, The Ohio State University, Columbus, OH, USA

2. School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA

Funder

U.S. National Science Foundation (NSF) CAREER

Innovators

Dr. Ilya Vitebskiy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Link

Reference33 articles.

1. Exploiting nonlinear properties of VO2 in a mmWave antenna-coupled sensor;chen;Tech Dig Solid-State Sensor Actuator Workshop,2022

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