Affiliation:
1. Foundry Division, Product and Test Engineering Team, Samsung Electronics, Yongin, South Korea
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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1. The Characterization of Near-Field Microwave Radiation Via Scanning Probe Microscopy;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09
2. Absorption Markov Lifetime Evaluation Model Based on Weibull Distribution;2022 10th International Symposium on Next-Generation Electronics (ISNE);2023-05-12