An Experimentally Tuned Compact Electrical Model for Laser Fault Injection Simulation
Author:
Affiliation:
1. Mines Saint-Étienne, CEA-LETI, Centre CMP,Gardanne,France,F - 13541
2. French Aerospace Laboratory, ONERA,Toulouse,France
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9897157/9897171/09897189.pdf?arnumber=9897189
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1. Optical fault induction attacks;skorobogatov;CHES 2002 Revised Papers from the 4th International Workshop on Cryptographic Hardware and Embedded Systems,2002
2. Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection
3. Best Practices for Compact Modeling in Verilog-A
4. The Use of Lasers to Simulate Radiation-Induced Transients in Semiconductor Devices and Circuits
5. Charge generation and collection in p-n junctions excited with pulsed infrared lasers
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