Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Surface Roughness Measurement of Functionalized CVD Graphene and Hexagonal Boron Nitride Heterostructures Using Atomic Force Microscopy

Published:2024-05-02 Issue: Volume:11 Page:1-6
ISSN:
Container-title:2024 IEEE 19th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
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Author:

Addo-Mensah Evans¹,John Ashby Philip²,Reynolds Katlin³,De Oliveira Fernando Maia⁴,Churchill Hugh²,Wejinya Uchechukwu⁵

Affiliation:

1. University of Arkansas,Dept. Materials Science and Engineering,Fayetteville,USA

2. University of Arkansas,Dept. Physics,Fayetteville,USA

3. University of Arkansas,Physics,Fayetteville,USA

4. University of Arkansas,Dept. Institute for Nanoscience and Engineering,Fayetteville,USA

5. University of Arkansas,Dept. Mechanical Engineering,Fayetteville,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10639541/10639542/10639924.pdf?arnumber=10639924

Reference36 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Electronic Confinement and Coherence in Patterned Epitaxial Graphene

3. The rise of graphene

4. Graphene-based composite materials

5. A Chemical Route to Graphene for Device Applications

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