160 Gb/s/Port 2$\,\times\,$2 OPS Node Test-Bed Performing 50 Gchip/s All-Optical Active Label Processing With Contention Detection-Reference-Cited by-同舟云学术

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160 Gb/s/Port 2$\,\times\,$2 OPS Node Test-Bed Performing 50 Gchip/s All-Optical Active Label Processing With Contention Detection

Published:2010-03 Issue:6 Volume:28 Page:922-930
ISSN:0733-8724
Container-title:Journal of Lightwave Technology
language:
Short-container-title:J. Lightwave Technol.

Author:

Scaffardi Mirco,Lazzeri Emma,Furukawa Hideaki,Wada Naoya,Miyazaki Tetsuya,Poti Luca,Bogoni Antonella

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx5/50/5420223/05308243.pdf?arnumber=5308243

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Performance analysis of all optical contention detection circuit for high speed optical access networks;Optical and Quantum Electronics;2022-06-06

2. 4-Bit All-Optical Serial-to-Parallel Converter With Sub-dB/cm Delay Lines Based on Rib Waveguides;Journal of Lightwave Technology;2021-10

3. All-optical serial-to-parallel converter based on nonlinear effects in silicon microring resonators;IEICE Electronics Express;2020-08-25

4. Improvement of contrast ratio in quadriphase-shift-keying optical label recognition with passive optical waveguide circuit;Optical Engineering;2016-05-31

5. All-Optical Digital Circuits Exploiting SOA-Based Loop Memories;IEEE Journal of Selected Topics in Quantum Electronics;2012-03

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