Precision Threshold Current Measurement for Semiconductor Lasers Based on Relaxation Oscillation Frequency
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Atomic and Molecular Physics, and Optics
Link
http://xplorestaging.ieee.org/ielx5/50/5153581/04840457.pdf?arnumber=4840457
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Sensing by Dynamics of Lasers with External Optical Feedback: A Review;Photonics;2022-06-27
2. Influence of feedback optical phase on the relaxation oscillation frequency of a semiconductor laser and its application;Optics Express;2021-01-19
3. A simple and precise method for the threshold current determination in vertical-cavity surface-emitting lasers;Optica Applicata;2020
4. Measuring Linewidth Enhancement Factor by Relaxation Oscillation Frequency in a Laser with Optical Feedback;Sensors;2018-11-16
5. Instantaneous frequency measurement applied to semiconductor laser relaxation oscillations;Applied Physics B;2009-11-05
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