Design, Simulation, and Fault Analysis of a 6.5-MV LTD for Flash X-Ray Radiography-Reference-Cited by-同舟云学术

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Design, Simulation, and Fault Analysis of a 6.5-MV LTD for Flash X-Ray Radiography

Published:2006-10 Issue:5 Volume:34 Page:1888-1899
ISSN:0093-3813
Container-title:IEEE Transactions on Plasma Science
language:
Short-container-title:IEEE Trans. Plasma Sci.

Author:

Leckbee J.J.,Maenchen J.E.,Johnson D.L.,Portillo S.,VanDeValde D.M.,Rose D.V.,Oliver B.V.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Condensed Matter Physics,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/27/36078/01710055.pdf?arnumber=1710055

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