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Performance Comparisons Between 7-nm FinFET and Conventional Bulk CMOS Standard Cell Libraries

  • Published:2015-08 Issue:8 Volume:62 Page:761-765
  • ISSN:1549-7747
  • Container-title:IEEE Transactions on Circuits and Systems II: Express Briefs
  • language:
  • Short-container-title:IEEE Trans. Circuits Syst. II

Author:

Xie Qing,Lin Xue,Wang Yanzhi,Chen Shuang,Dousti Mohammad Javad,Pedram Massoud

Funder

Defense Advanced Research Projects Agency

Power Efficiency Revolution for Embedded Computing Technologies (PERFECT) program

National Science Foundation

Software and Hardware Foundations

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

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