The Impact of Soft Errors in Memory Units of Edge Devices Executing Convolutional Neural Networks
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/8920/9736462/09674038.pdf?arnumber=9674038
Reference22 articles.
1. Impact of Reduced Precision in the Reliability of Deep Neural Networks for Object Detection
2. Non-intrusive Fault Injection Techniques for Efficient Soft Error Vulnerability Analysis
3. Understanding error propagation in deep learning neural network (DNN) accelerators and applications
4. Fine-Grained Vulnerability Analysis of Resource Constrained Neural Inference Accelerators
5. Tolerating Soft Errors in Deep Learning Accelerators with Reliable On-Chip Memory Designs
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