A Low-Complexity Method to Address Process Variability in True Random Number Generators based on Digital Nonlinear Oscillators
Author:
Affiliation:
1. University of Siena,Dept. of Information Engineering and Mathematics,Via Roma,Siena,(Italy),56 - 53100
2. University of Udine,Computer Science and Physics,Dept. of Mathematics,Via delle Scienze,Udine,(Italy),206 - 33100
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9937201/9937203/09937869.pdf?arnumber=9937869
Reference27 articles.
1. An All-Digital Edge Racing True Random Number Generator Robust Against PVT Variations
2. 2.4 Gbps, 7 mW All-Digital PVT-Variation Tolerant True Random Number Generator for 45 nm CMOS High-Performance Microprocessors
3. An All-Digital and Jitter-Quantizing True Random Number Generator in SRAM-Based FPGAs
4. A Hybrid True Random Number Generator using Ring Oscillator and Digital Clock Manager
5. TI-TRNG
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