Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection
Author:
Affiliation:
1. Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9937201/9937203/09937644.pdf?arnumber=9937644
Reference12 articles.
1. Power Management Techniques for Integrated Circuit Design
2. Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage
3. Built-in self-test for stability measurement of low dropout regulator
4. Fault modeling and testing generation for sample-and-hold circuits;soma;1991 IEEE International Sympoisum on Circuits and Systems,1991
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