1. Calibrated Sinefit Based on Quantized Data;2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2024-05-20
2. One-Bit Measurements in Microwave Resonators;IEEE Transactions on Instrumentation and Measurement;2024
3. Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN;IEEE Transactions on Instrumentation and Measurement;2024
4. Asymptotic Properties of a One-bit Estimator of Parametric Signals;2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2023-05-22
5. One-Bit Time-domain Sensing in Microwave Resonators;2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2023-05-22