Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification-Reference-Cited by-同舟云学术

Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification

Author:

Zheng Zhaohui¹,Xu Bichao²^ORCID,Ju Jianping³,Guo Zhongyuan⁴,You Changhui⁴,Lei Qiang⁵^ORCID,Zhang Qiang⁶

Affiliation:

1. School of Mathematics and Physics, Wuhan Institute of Technology, Wuhan, China

2. Department of Wuhan Institute of Virology, Chinese Academy of Sciences, Wuhan, China

3. School of Artificial Intelligence, Hubei Business College, Wuhan, China

4. School of Electronic Information, Wuhan University, Wuhan, China

5. School of Electrical Information Engineering, Wuhan Institute of Technology, Wuhan, China

6. Wuhan Railway Vocational College of Technology, Wuhan, China

Funder

Science Research Project of Wuhan Institute of Technology

Program for Innovative Research Team in the Wuhan Railway Vocational College of Technology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Networks and Communications,Safety, Risk, Reliability and Quality

Link

Reference34 articles.

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