On Microstructure Estimation Using Flatbed Scanners for Paper Surface-Based Authentication
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Published:2021
Issue:
Volume:16
Page:3039-3053
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ISSN:1556-6013
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Container-title:IEEE Transactions on Information Forensics and Security
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language:
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Short-container-title:IEEE Trans.Inform.Forensic Secur.
Author:
Liu Runze,
Wong Chau-WaiORCID
Funder
Analytical Instrumentation Facility (AIF), North Carolina State University
State of North Carolina
National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computer Networks and Communications,Safety, Risk, Reliability and Quality