Radiation damage and single event effect results for candidate spacecraft electronics-Reference-Cited by-同舟云学术

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Radiation damage and single event effect results for candidate spacecraft electronics

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Container-title:2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527)
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Author:

O'Bryan M.V.,LaBel K.A.,Reed R.A.,Howard J.W.,Ladbury R.L.,Barth J.L.,Kniffin S.D.,Seidleck C.M.,Marshall P.W.,Marshall C.J.,Kim H.S.,Hawkins D.K.,Sanders A.B.,Carts M.A.,Forney J.D.,Roth D.R.,Kinnison J.D.,Nhan E.,Sahu K.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7187/19357/00896279.pdf?arnumber=896279

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Single Event Effect and Total Ionizing Dose Performance at High and Low Dose Rate of a 16 Bit Digital-to-Analog Converter;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03

2. Fast-Transient Radiation-Hardened Low-Dropout Voltage Regulator for Space Applications;IEEE Transactions on Nuclear Science;2021-05

3. Radiation Prescreening of SIOS Optical Link;2009 IEEE Radiation Effects Data Workshop;2009-07

4. Compendium of Single Event Effects Radiation Test Results from Ball Aerospace & Technologies Corp.;2009 IEEE Radiation Effects Data Workshop;2009-07

5. A Comparison of the Effects of X-Ray and Proton Irradiation on the Performance of SiGe Precision Voltage References;IEEE Transactions on Nuclear Science;2007-12

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