TID, SEE and radiation induced failures in advanced flash memories

Author:

Nguyen D.N.,Scheick L.Z.

Publisher

IEEE

Cited by 24 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Radiation characterization of COTS MicroSD Memories for CERN applications;2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2019-09

2. Space and terrestrial radiation effects in flash memories;Semiconductor Science and Technology;2017-02-21

3. Evaluation of 1.5-T Cell Flash Memory Total Ionizing Dose Response;IEEE Transactions on Nuclear Science;2015-12

4. NAND flash storage technology for mission-critical space applications;IEEE Aerospace and Electronic Systems Magazine;2013-09

5. Radiation Effects in Flash Memories;IEEE Transactions on Nuclear Science;2013-06

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