Machine Learning-Based Overkill Reduction through Inter-Test Correlation
Author:
Affiliation:
1. The University of Texas at Dallas,Department of Electrical and Computer Engineering,Richardson,TX,USA, 75080
2. Texas Instruments Inc.,Dallas,TX,USA, 75243
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9793839/9794139/09794170.pdf?arnumber=9794170
Reference20 articles.
1. Non-RF to RF Test Correlation Using Learning Machines: A Case Study
2. Correlating inline data with final test outcomes in analog/RF devices
3. Test data analytics — Exploring spatial and test-item correlations in production test data
4. Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations
5. Excursion Yield Loss and Cycle Time Reduction in Semiconductor Manufacturing
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