A new on-wafer de-embedding technique for on-chip rf transmission line interconnect characterization-Reference-Cited by-同舟云学术

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A new on-wafer de-embedding technique for on-chip rf transmission line interconnect characterization

Published:2004 Issue: Volume: Page:
ISSN:
Container-title:ARFTG 63rd Conference, Spring 2004
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Author:

Tretiakov Y.,Vaed K.,Woods W.,Venkatadri S.,Zwick T.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/9529/30199/01387857.pdf?arnumber=1387857

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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