Sea level failures of power MOSFETs displaying characteristics of cosmic radiation effects-Reference-Cited by-同舟云学术

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Sea level failures of power MOSFETs displaying characteristics of cosmic radiation effects

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Container-title:2002 IEEE 33rd Annual IEEE Power Electronics Specialists Conference. Proceedings (Cat. No.02CH37289)
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Author:

Sheehy R.,Dekter J.,Machin N.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/7959/22001/01023062.pdf?arnumber=1023062

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Failure Rate Calculation Due to Neutron Flux with SiC MOSFETs and Schottky Diodes;2022 IEEE 9th Workshop on Wide Bandgap Power Devices & Applications (WiPDA);2022-11-07

2. Electric-Field-Dependence Mechanism for Cosmic Ray Failure in Power Semiconductor Devices;IEEE Transactions on Electron Devices;2021-07

3. Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies;IEEE Transactions on Nuclear Science;2021-05

4. Neutron Radiation Failure-in-time Test of 1200V and 1700V SiC Power Transistors;2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC);2020-11

5. Single Event Effects in Si and SiC Power MOSFETs Due to Terrestrial Neutrons;IEEE Transactions on Nuclear Science;2017-01

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