Ageing Analysis of Embedded SRAM on a Large-Scale Testbed Using Machine Learning
Author:
Affiliation:
1. Deutsches Elektronen-Synchrotron DESY,Germany
2. Hamburg University of Applied Sciences,Germany
3. Hamburg University of Technology,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10456758/10456769/10456825.pdf?arnumber=10456825
Reference26 articles.
1. A review of techniques for ageing detection and monitoring on embedded systems;Lanzieri,2023
2. A Guideline on Pseudorandom Number Generation (PRNG) in the IoT
3. DRV-Fingerprinting: Using Data Retention Voltage of SRAM Cells for Chip Identification
4. PUF for the Commons: Enhancing Embedded Security on the OS Level
5. TARDIS: Time and remanence decay in SRAM to implement secure protocols on embedded devices without clocks;Rahmati,2012
Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Review of Techniques for Ageing Detection and Monitoring on Embedded Systems;ACM Computing Surveys;2024-09-06
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