Author:
Tiwari Deepika,Zhang Long,Monperrus Martin,Baudry Benoit
Funder
Wallenberg AI
Autonomous Systems and Software Program
Knut and Alice Wallenberg Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
7 articles.
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1. Generating Understandable Unit Tests through End-to-End Test Scenario Carving;2023 IEEE 23rd International Working Conference on Source Code Analysis and Manipulation (SCAM);2023-10-02
2. In vivo test and rollback of Java applications as they are;Software Testing, Verification and Reliability;2023-06-25
3. Regression Test Generation by Usage Coverage Driven Clustering on User Traces;2023 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW);2023-04
4. RICK: Generating Mocks from Production Data;2023 IEEE Conference on Software Testing, Verification and Validation (ICST);2023-04
5. A Case Against Coverage-Based Program Spectra;2023 IEEE Conference on Software Testing, Verification and Validation (ICST);2023-04