The Influence of Properties of Solder Joint on the Stress of Underfill in Flip Chip Package

Author:

Li Chenglong1,Zhong Cheng2,Jiang Ruoyu3,Li Yulong4,Chen Mingxiang5,Lu Jibao1,Sun Rong1

Affiliation:

1. Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Science,Shenzhen,China,518055

2. Huazhong University of Science and Technology,School of Mechanical Science and Engineering,Shenzhen,China,518055

3. Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institute of Advanced Technology, Chinese Academy of Science,Shenzhen,China

4. University of Science and Technology of China,Suzhou,China

5. Huazhong University of Science and Technology,School of Mechanical Science and Engineering,Wuhan,China

Funder

National Natural Science Foundation of China

Youth Innovation Promotion Association

Publisher

IEEE

Reference19 articles.

1. Mechanisms of die and underfill cracking in flip chip PBGA package;shim;Proc Advanced Packaging Materials,2000

2. The effect of underfill and underfill delamination on the thermal stress in flip-chip solder joints;rzepka;Transactions of the ASME,1998

3. Investigation of thermomechanical behaviors of flip chip BGA packages during manufacturing process and thermal cycling;tsai;IEEE Transactions on Components and Packaging Technologies,2004

4. Characterization of Viscoelastic Response of Underfill Materials

5. Numerical analysis of plastic encapsulated electronic package reliability: Viscoelastic properties of underfill resin

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