Modeling and Characterization of the Effect of Misalignment between Microsphere-Sensor on the Sensitivity of Microsphere-Lens-Enhanced MWIR SLS Photodetectors-Reference-Cited by-同舟云学术

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Modeling and Characterization of the Effect of Misalignment between Microsphere-Sensor on the Sensitivity of Microsphere-Lens-Enhanced MWIR SLS Photodetectors

Published:2021-08-16 Issue: Volume: Page:
ISSN:
Container-title:NAECON 2021 - IEEE National Aerospace and Electronics Conference
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Author:

Megherbi D. B.¹,Mack P.¹,DiZoglio J.¹,Vakil M.I.¹,Limberopoulos N.²,Urbas A.³

Affiliation:

1. University of Massachusetts,CMINDS Research Center,Department of Electrical and Computer Engineering,Lowell,MA,USA

2. Air Force Research Laboratory, Sensors Directorate

3. Air Force Research Laboratory, Materials Directorate,Wright-Patterson AFB,OH,USA,45433

Funder

Air Force Research Laboratory

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9696307/9696308/09696442.pdf?arnumber=9696442

Reference11 articles.

1. Mid Infrared Focal Plane Arrays with Nanoscale Quantum Dots and Superlattices

2. Density of kinks on a dislocation segment in thermodynamic equilibrium and the interaction between solitons

3. Analysis of the Effect of Microsphere-lens Material Spectral Absorption on the Overall FTIR Spectral Response of MWIR (3?m-Sum) Microsphere-Lens-Enhanced SLS Photo Detectors;megherbi;Proceedings of the 2015 IEEE National Conference on Aerospace and Electronics NAECON-OIS,0

4. Characterization of difference detection thresholds in AWGN-degraded images by using full reference metrics

5. Characterization and estimation of microsphere-lens misalignment from FTIR response data of microsphere-lens-enhanced MWIR SLS photo detectors

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