1. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
2. Migrating a Complex Industry to Cloud;Cloud Computing with Security and Scalability.;2022-09-04
3. Machine Learning for Testability Prediction;Machine Learning Applications in Electronic Design Automation;2022
4. Migrating a Complex Industry to Cloud;Cloud Computing with Security;2019-09-05
5. Migrating a Complex Industry to Cloud;Cloud Computing;2018