SyntaxLineDP: a Line-level Software Defect Prediction Model based on Extended Syntax Information-Reference-Cited by-同舟云学术

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SyntaxLineDP: a Line-level Software Defect Prediction Model based on Extended Syntax Information

Published:2023-10-22 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security (QRS)
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Author:

Zhu Jianzhong¹,Huang Yuan²,Chen Xiangping³,Wang Ruomei¹,Zheng Zibin²

Affiliation:

1. Sun Yat-sen University,School of Computer Science and Engineering,Guangzhou,Guangdong,China

2. Sun Yat-sen University,School of Software Engineering,Zhuhai,Guangdong,China

3. Sun Yat-sen University,School of Journalism and Communication,Guangzhou,Guangdong,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10366457/10366528/10366602.pdf?arnumber=10366602

Reference47 articles.

1. A systematic literature review of software defect prediction;Wahono;Journal of Software Engineering,2015

2. Survey on software defect prediction techniques;Thota;International Journal of Applied Science and Engineering,2020

3. Fair and balanced?

4. Naive Bayes Software Defect Prediction Model

5. Software Defect Prediction via Convolutional Neural Network

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