Modeling an ESD Gun Discharge to a USB Cable-Reference-Cited by-同舟云学术

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Modeling an ESD Gun Discharge to a USB Cable

Published:2022-08-01 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
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Author:

Xu Yang¹,Zhou Jianchi¹,Beetner Daryl¹,Meiguni Javad²,Pommerenke David³,Bub Sergej⁴,Holland Steffen⁴

Affiliation:

1. Missouri University of Sci. and Tech.,Rolla,MO

2. Lab 216, Amazon,Sunnyvale,CA

3. Graz University of Technology,Graz,Austria

4. NExperia Germany GmbH,Hamburg,Germany

Funder

National Science Foundation (NSF)

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9889328/9889311/09889484.pdf?arnumber=9889484

Reference7 articles.

1. Overshoot-induced failures in forward-biased diodes: A new challenge to high-speed ESD design

2. SEED Modeling of an ESD Gun Discharge to a USB Cable Surrogate

3. The effect of USB ground cable and product dynamic capacitance on IEC61000-4-2 qualification

4. System Level ESD Analysis - A Comprehensive Review II on ESD Coupling Analysis Techniques;yousaf;Journal of Electrical Engineering and Technology,2018

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improved SEED Modeling of an ESD Discharge to a USB Cable;IEEE Transactions on Electromagnetic Compatibility;2023-06

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