Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress-Reference-Cited by-同舟云学术

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Neutron-Induced Multiple Bit Upsets on Two Commercial SRAMs Under Dynamic-Stress

Published:2012-08 Issue:4 Volume:59 Page:893-899
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Rech P.,Galliere J.-M.,Girard P.,Griffoni A.,Boch J.,Wrobel F.,Saigne F.,Dilillo L.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/6268392/06168809.pdf?arnumber=6168809

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