Study on the Off-State Breakdown Mechanism and Performance of Copolymer Lateral Drift Region-Organic Field-Effect Transistor Using TCAD Tool-Reference-Cited by-同舟云学术

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Study on the Off-State Breakdown Mechanism and Performance of Copolymer Lateral Drift Region-Organic Field-Effect Transistor Using TCAD Tool

Published:2024 Issue: Volume: Page:1-6
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Zhang Jun¹^ORCID,Wu Xin¹^ORCID,Lin Haonan¹^ORCID,Wang Lei¹,Zhang Hao¹^ORCID,Wang Fubin¹^ORCID,Li Man¹^ORCID,Huang Chenyang¹^ORCID,Chen Jing¹^ORCID,Zhang Maolin¹^ORCID,Yao Jiafei¹^ORCID,Zhang Guobin²,Bai Song²,Guo Yufeng¹^ORCID

Affiliation:

1. College of Integrated Circuit Science and Engineering and the National and Local Joint Engineering Laboratory for RF Integration and Micro-Packaging Technologies, Nanjing University of Posts and Telecommunications, Nanjing, China

2. State Key Laboratory of Wide-Bandgap Semiconductor Power Electronic Devices, Nanjing Electronic Devices Institute, Nanjing, China

Funder

National Natural Science Foundation of China

Nanjing Science and Technology Plan Project

Jiangsu Science and Technology Achievement Transformation Project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/16/4358746/10643819.pdf?arnumber=10643819

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